Orbis Micro-XRF Analyzer
Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro-EDXRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

Orbis PC SDD - Micro-XRF Analyzer
The standard Orbis analyzer is ideal for applications that require large-particle or large feature analysis. This would include criminal forensics or industrial quality control work. The instrument has an industry-leading LN-Free X-ray silicon drift detector (SDD) and a color video camera with 10x and 100x magnification.

Orbis Silicon Drift Detector (SDD) Analyzer
The Orbis PC SDD analyzer is an upgraded model that is exceptionally well suited to analyze smaller samples or make faster measurements. The instrument is delivered with an advanced, LN-Free X-ray silicon drift detector (SDD), enhanced color video camera with 3x digital zoom, and a 30 µm polycapillary lens.

Orbis Vision Software
The Orbis Vision software provides the user with an easy-to-use interface while allowing control for applications requiring more powerful analytical tools. Sample navigation capabilities allow for simple point and analyze, saving of multiple sample positions for automated analysis, and importation of sample images from other tools to correlate analysis between Orbis and other microanalytical tools.