Software
Genesis provides materials characterization solutions for many X-ray microanalysis applications, from straight forward qualitative analysis and accurate quantitative analysis to fast X-ray mapping and automated particle classification. Genesis includes many features: 

• EXpert ID, the revolutionary standard for elements identification
• Halographic Peak Deconvolution (HPD) for visual peak identification and confirmation
• ViP Quant for accurate quantitative analysis under low or variable pressure conditions
• SnapShot for automatic acquisition of spectra at user-defined time intervals to examine
  the interaction of samples and the electron beam
• Live Spectral Mapping for every analytical requirement featuring linescan capabilities
• Element Detective for easy identification of the smallest particle or phase
• Particle Analysis for full automated data acquisition and analysis of particles