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TEAM™ EDS for TEM Analysis
Whether your focus is phase mapping or spectra collection, the TEAM™ EDS system for TEM provides the Smart Features that make analysis faster and easier. Our analytic platform is powered by EXpert ID, a revolutionary new peak identification program. By combining known peak locations and rules-based theory, complex overlaps are deconvoluted and trace peaks identified, resulting in the most accurate element identification available.
EXpert ID offers the following benefits:
- Identifies possible trace elements that may require further investigation
- Improves performance for weak lines that contain major overlaps
- Increases accuracy for low kilovolt conditions where fewer lines are available
The TEM quantification algorithm for thin material is bases on the Cliff-Lorimer method for fast and accurate analysis. The user has the flexibility to work in conjunction with standards to determine one's own Cliff-Lorimer factors and theroetical methods.
TEAM™ EDS also incorporates Smart Drift Correction available for STEMs, a unique capability that dynamically adjusts the drift correction frequency based on changes that occur during data collection. It is virtually impossible to forecast how much a sample will drift, the rate of drift, or how frequently the drift should be addressed. In TEAM™ EDS, no user interaction is required to correct for these problems. With Smart Drift Correction, setup parameters are either predicted or calculated for the user and can be dynamically adjusted during analysis.
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The BSE image on top shows atomic number contrast, while the middle CPS map shows count rate contrast, which differs in several areas. The bottom CPS deviation map further highlights those differences. |
Point Analysis & Line Scan
TEAM™ EDS Point Analysis utilizes next-generation element identification and quantification models and algorithms for the fastest, most accurate EDS spectra collection. Whenever a spectrum is gathered, EXpert ID’s element routine begins and automatically identifies elements present in the spectrum. Each peak will be labeled according to its K, L, or M energy line. As the Smart Quant routine is applied, weight and atomic percentages are calculated for each identified element.
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Spectra can be collected across the specimen's image area, including individual points, multiple points, selected areas, freehand draw, and line scans.
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Spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas, freehand draw, and line scans. The line scans provide additional flexibility to customize the number of measurement points in a line. The resolution of line scan can be selected from preset options or it can be customized in both axial and transverse directions. Each spectrum will be analyzed and the peaks identified. Deconvolution (HPD) synthesizes a theoretical spectrum model, which is overlaid on the collected spectra. It can easily confirm the presence or absence of elements where severe overlaps occur.
Each color represents a separate phase (red=Al, yellow=Cu-Al, blue=Si, orange=Mg-rich). Note that the orange phase could not be found when drift correction was not used. The drift offset table is also shown - note that it is possible to correct for sub-pixel drift. |
Elemental maps, together with the phase map, image, and a map that shows the total counts at each pixel.
Smart Phase Mapping
EDAX’s revolutionary new Smart Phase Mapping changes the way you look at elemental analysis. Now you can view and interact with your data while maps are being collected. In virtually no time and with no user setup, Smart Phase Mapping automatically collects spectra, elemental maps, and phase maps with elemental distributions and associated spectra. You can also choose the data quality required for your map, eliminating the need for user input. A highly skilled operator is no longer required for accurate phase determination.
TEAM™ EDS provides a unique display dedicated to the majority of the field of view. Once the "collect data" activity is in progress, the system automatically gathers a smart preview spectrum. This sets up the initial table of elements being mapped and is updated during the mapping process. Smart Phase Mapping begins to make a provisional analysis of the EDS data being collected at each point or pixel and assigns a phase according to the combination of elements being measured. The chemistry is represented in a pie chart. During the mapping process, you can choose to display phase to element, element to phase, or counts per second.
TEAM™ EDS operates as if an expert is inside the system, giving every level of operator an invaluable tool that rapidly generates results they can trust.
Elemental maps, together with the phase map, image, and a map that shows the total counts at each pixel. |
Smart Phase Mapping allows users to interactively work with the dataset during collection.
TEAM™ EDS Brochure
TEAM™ Smart CPS Mapping Bulletin
TEAM™ Smart Phase Mapping Bulletin
TEAM™ Smart Features Bulletin
TEAM™ Smart Drift Correction Bulletin
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