Energy Dispersive X-ray Spectroscopy (EDS)
TEAM™ EDS Analysis System for SEM – X-ray Microanalysis
TEAM™ EDS Analysis System for Scanning Electron Microscope (SEM) is offered with Octane Silicon Drift Detector (SDD) Series for a wide range of applications. The TEAM™ EDS Analysis System coupled with Smart Features is the most intuitive and easy to use analytical tool available for the SEM.
TEAM™ EDS for TEM - X-ray Microanalysis
TEAM™ EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series provides the ultimate analytical solution for transmission electron microscope (TEM). The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use.
Octane Silicon Drift Detector (SDD) Series for the Scanning Electron Microscope (SEM)
SDD technology for the SEM is the preferred choice for X-ray microanalysis today. EDAX’s Octane SDD series offers superior light element performance with the best collection efficiency available, capable of accepting extremely high count rates with excellent resolution.
Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM)
EDAX’s Octane SDD Series for the TEM are the world's first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.
The Si(Li) Detector
EDAX’s Sapphire Si(Li) Detector for the SEM and TEM, with classic 10-Liter Dewar, provides excellent light element performance and improved collection efficiency with heavy elements. EDAX’s Si(Li) retractable transmission electron microscope (r-TEM) detector utilizes a unique design that provides protection and enhances analytical performance.