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EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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Energy Dispersive X-ray Spectroscopy (EDS)

EDAX TEAM™ EDS Analysis System for the Scanning Electron Microscope (SEM)

TEAM™ EDS Analysis System for SEM – X-ray Microanalysis
TEAM™ EDS Analysis System for Scanning Electron Microscope (SEM) is offered with Octane and Octane Elite Silicon Drift Detector (SDD) Series for a wide range of applications.  The TEAM™ EDS Analysis System coupled with Smart Features is the most intuitive and easy to use analytical tool available for the SEM.

EDS spectrum with two matching spectra overlaid

Spectrum Library Matching in TEAM™ Analysis
Spectrum Matching is an automatic function that allows the user to search through a custom built spectrum library to find similar spectra. This greatly simplifies identification of unknowns by comparing them to a group of potential candidates and reduces the complexity of finding discrepancies and similarities between spectra.

EDAX TEAM™ 3D Imaging and Quant (IQ)

TEAM™ 3D Imaging and Quant (IQ)
The optional TEAM™ 3D IQ software is a 3D solution for EDS data, which performs both imaging and analysis operations within the same software package. EDAX offers simple, one click data transfer between the TEAM™ EDS platform and TEAM™ 3D IQ for the most comprehensive visual and analytical interpretation of EDS data available.

EDAX TEAM™ EDS Analysis System for the Transmission Electron Microscope (TEM)

TEAM™ EDS Analysis System for TEM - X-ray Microanalysis
TEAM™ EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series provides the ultimate analytical solution for transmission electron microscope (TEM). The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use.

EDAX Octane II Silicon Drift Detector (SDD) Series for the Scanning Electron Microscope (SEM)

Octane Silicon Drift Detector (SDD) Series for the Scanning Electron Microscope (SEM)
SDD technology for the SEM is the preferred choice for X-ray microanalysis today. EDAX’s Octane SDD series offers superior light element performance with the best collection efficiency available, capable of accepting extremely high count rates with excellent resolution.

Al L to Al K peak height ratio of 1:1 at 2.5 kV 

Octane Elite Silicon Drift Detector (SDD) Series
The game changing advancements in the Octane Elite SDD Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.

EDAX Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM)

Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM)
EDAX’s Octane SDD Series for the TEM are the world's first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.

EDAX Element Silicon Drift Detector (SDD)

Element Silicon Drift Detector (SDD) for both SEM and TEM
The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.

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