EDAX provides EDS, EBSD, WDS and Micro-XRF materials characterization solutions
Search
Contact Us -  Visit the EDAX Japan website - Visit the EDAX China website


Home
EDAX is part of the Ametek Materials Analysis Division
EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
Path: Home>Products>EDS>Detectors>LEXS (Low Energy X-ray Spectometer)

Low Energy X-ray Spectrometer (LEXS)



The LEXS is a PBS (parallel beam spectrometer) that employs high collection optics (HCO) enabling the spectrometer to efficiently collect X-rays from 100eV to 2.4keV (B K to S K). It is specifically designed for low energy X-ray microanalysis and high magnification (<5kV) SEM analysis.

LEXS Features:

  • Captures the highest count rates of any WDS system available, providing rapid X-ray analysis at the best resolutions obtainable
  • Provides high count rates and peak-to-background ratios, superior low energy resolution, <20eV for X-ray energies below 2.5keV
  • Resolves such overlaps as Si Kα from W or Ta Mα and N Kα from Ti Lα.
  • Enables count rates that allow for high speed analysis
  • Uses the M lines to measure the higher atomic number elements such as Cr, Fe and Cu

Literature Downloads
Light Element X-ray Spectrometer Bulletin
LambdaSpec Bulletin
 


Join EDAX on LinkedIn

Home - CareersContact Us 

© Copyright 2013 EDAX Inc. All Rights Reserved 

Privacy PolicyTrademarksSitemap - www.ametek.com