OIM™ Data Collection EBSD SEM

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OIM™ Data Collection

OIM™ Data Collection software creates a powerful, easy-to-use environment for acquiring crystallographic data in the SEM using Electron Backscatter Diffraction (EBSD). It features automated collection and indexing to provide the highest indexing success rates and data quality across all types of samples.

The software utilizes precise Hough transform, unique indexing algorithms, and a patented confidence index to provide the most robust and accurate indexing for determining crystallographic orientation.

Screencap-oim-dc
OIM™ Data Collection software provides interactive and automated collection and indexing.

Triplet Indexing and the Confidence Index

OIM™ Data Collection software incorporates our unique Triplet Indexing algorithms. This technology improves indexing reliability and precision while minimizing trade-offs between data collection speed and data accuracy.

Triplet Indexing provides the foundation for EDAX’s patented Confidence Index. This innovative technology enables the verification of indexing accuracy to generate superior EBSD pattern analysis and subsequent data quality. A statistical means of indexing quality, the Confidence Index indicates the difference between the best and second-best solutions. It makes it easy to quickly find, highlight, and if needed, remove suspect points from a dataset. The Confidence Index readily handles false bands and enables deconvolution of overlapping patterns.

OIM™ Data Collection software has embedded camera and forward-scatter imaging controls. In addition, collection speeds are adjustable without significantly sacrificing accuracy. Choose from different XRD-based crystallographic databases and an electron diffraction-based EDAX database containing more than 300 phases.

Literature Downloads
OIM™ 6.0 Software Bulletin
Pegasus

Forward scatter detector image illustrating orientation and compositional contrast of a quartz-enstatite sample courtesy of Dr. Karsten Kunze, Geologisches Institut, Zurich, Switzerland.