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EDAX offers energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), wavelength dispersive spectrometry (WDS) and micro x-ray fluorescence (Micro-XRF) products
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New OIM Analysis™ v8 Software Now Available



Phase maps showing Al-Si original data (left) and with ChI-Scan reindexing (right) 

If you purchased EDAX EBSD equipment in 2016, you may be eligible for a free OIM Analysis™ v8 upgrade. Special pricing is available for all other customers. Please fill out the form below to check your eligibility. Please click here for instructions on how to generate the Computer ID File.

Note: Complimentary upgrades are for self-installed software only and do not include a service visit. If remote service or a service visit is required, standard service fees may apply.

OIM Analysis™ v8

  • Comprehensive toolbox for the analysis of EBSD mapping data
  • Optimized for multi-core PCs for faster visualization and analysis
  • EBSD pattern indexing for off-line rescanning of EBSD data
  • Includes ChI-Scan functionality
  • Anti-grain determination for pore analysis


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