|
OIM™ Analysis System EBSD
EDAX’s OIM™ Analysis System is the most comprehensive solution available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase- distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM).
|
|
Hikari EBSD Detector
EDAX's Hikari high speed and high sensitivity CCD detector allows users to obtain consistently high quality data in shorter times. Hikari is a full featured, completely integrated CCD-based detector that excels at all EBSD applications, whether they require speed and sensitivity or signal to noise performance. Hikari can achieve simultaneous acquisition and indexing speeds up to 450 patterns per second for many materials. |
|
DigiView IV EBSD Detector
EDAX's DigiView IV is a versatile high resolution; high sensitivity digital camera tailored for high throughput scientific applications. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating resulting in higher sensitivity for EBSD applications. |
|
Forward Scatter Detector
The FSD is an ideal analytical tool for visualizing the microstructure to select a region for OIM™ data collection and for qualitatively inspecting the microstructure to characterize deformation and strain gradients critical to materials design. |
|