EDAX’s OIM™ Analysis System is the most comprehensive solution available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase- distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM).The OIM™ system's ease of use enables analysts, engineers, or scientists, without specific diffraction or crystallography expertise, to fully analyze and characterize their samples. Its automated orientation measurement and rapid data collection boost user productivity by reducing analysis time and reducing potential errors.
The OIM™ Analysis System is the first microanalysis package to be written for a 64-bit processor and Microsoft® Windows 7 compatibility — providing the ability to handle very large scan files.
The OIM™ system’s template functionality includes “one-button” analysis using a comprehensive template library. Its expanded QuickGen Toolbar provides easy access to the most commonly used features without sacrificing the power and flexibility needed by advanced users.
The OIM™ system is an invaluable tool for quality control applications and materials problem solving. It is ideal for analytic applications involving structural materials, such as steel and aluminum, advanced ceramics, electronics, energy materials, and geological samples.
OIM™ Analysis Systems are offered with the latest EDAX EBSD detectors coupled with OIM™ Data Collection and Analysis software packages. OIM data collection-EBSD-SEM software is used with an EBSD detector and SEM to automatically capture and analyze EBSD patterns to compile OIM datasets. OIM™ Analysis software is a stand-alone application used for the creation of maps, plots, and charts detailing the sampled microstructure as well as the highlighting and partitioning of data for advanced and interactive analysis.
OIM™ Data Collection
OIM™Data Analysis
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OIM™ Analysis System map of a fatigued stainless steel sample. OIM™ Analysis can be used to generate a virtually unlimited selection of maps, charts, and plots to meet all your microstructural analysis requirements. |