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EDAX hosts a series of microanalysis web seminars that offer education on microanalysis technologies available to you today. The seminars will run for approximately one hour with time allowed for questions and answers. Please note, time or schedule may be subject to change. For more information please contact EDAX web seminars.
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From Chemistry to Structure with EDAX TEAM™ Pegasus May 18, 2012
EDS technology is a proven technique for collecting chemical information about materials. When combined with EBSD, a full understanding of the physical microstructure can be attained. This leads to a complete and comprehensive microanalysis technique, which is now fully integrated into the easy to use EDAX TEAM™ interface. Dynamic EDS and EBSD mapping allows real time data analysis while Smart Features guarantee optimized acquisition setup and data quality even for first time users.
In this 45 minute webinar you will:
• Understand how EDS chemistry translates into EBSD microstructure
• Explore applications of EDS and EBSD
• See first-hand how simultaneous EDS and EBSD information is collected and applied to understanding the sample
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Please click on the title of the seminar for access to the session. |
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EDAX TEAM™ Pegasus March 2012
TEAM™ Pegasus seamlessly combines the two materials characterization techniques of EDS and EBSD into one easy-to-use package that provides an intuitive way of investigating the elemental composition and crystal structure simultaneously.
In this webinar, you will:
• Learn the basics of integrated EDS and EBSD collection
• Learn how to apply the technology to real world materials
• See how microstructure reveals information that is undiscovered by EDS alone
• Gain an understanding of the many applications of an integrated EDS-EBSD product
Maximizing Your Efficiency with Quality Data Quickly and No Compromises January 2012
In today’s busy workplace, we have become used to multi-tasking and working on several projects and lab needs at once. How do you make sure that you are not sacrificing quality while you are maximizing your productivity? In this web session we will cover ways that the Team™ EDS Smart features will monitor your data to make sure that you are getting the best from your system. Learn how you can use TEAM™ EDS with the fastest and most efficient SDD electronics to go from data collection to reports in less than one minute while still maintaining confidence of your data's integrity.
In this web seminar we will cover:
• The relationship between electronics - throughput - efficiency
• Multipoint analysis setup and collection
• Phase mapping solutions in under a minute and the benefit compared to quant maps with sparse data
• One button reporting in many file formats
Who should attend?
• Analysts looking to maximize their productivity
• Labs with repetitive analyses who want to increase workflow
• Those who do not want to waste a lot of time compiling a complex report |
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| Please click on the title of the seminar for access to the session. |
Interactive Electron Backscatter Diffraction (EBSD) Web Seminar October 2011
In this session we turned remote control of the EDAX Electron Backscatter Diffraction (EBSD) system over to one of the web attendees to show how quickly and easily orientation scans can be collected.
EBSD is often considered an advanced technique with complex data for analysis. However, modern systems allow for data collection that can be set up within minutes, providing valuable data for advanced microstructural analysis. In this thirty minute session we started with an introduction to the parameters associated with data collection such as camera setup, pattern indexing and scan step size. We then turned remote control access over to an EDAX web attendee who set up scan parameters and started an EBSD scan. After attending this web session, users will understand the set up routines used in EBSD data collection and will gain system familiarity which they can apply to their own analytical needs. |
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Thermoelectric Materials Analysis with EBSD May 2011
Thermoelectric (TE) materials convert thermal gradients to useful electrical power or use electrical energy to manipulate thermal energy in cooling and heating applications. TE behavior is a function of the thermal and electrical conductivity of the material, and these intrinsic properties are anisotropic, or dependent on crystallographic orientation. Electron Backscatter Diffraction (EBSD) is an SEM based characterization tool for determining the orientation, grain boundary structure, and phase distribution comprising a material, and is therefore an ideal tool for analyzing and understanding thermoelectric materials and correlating this structure to the resultant performance.
In this web seminar we discuss
• The application of EBSD for thermoelectric research
• How engineering the orientation and grain boundary distributions
within a material can improve thermoelectric performance
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Problem Solving with Energy Dispersive Micro-XRF May 2011
A Spectroscopy webinar with EDAX presenters Dr. Bruce Scruggs and Dr. Andreas Wittkopp
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The Orbis - A Versatile µXRF Tool for ROHS and WEEE Compliance Testing April 2011
Energy Dispersive XRF, being non-destructive and requiring minimal sample preparation, is a well-established elemental analysis technique for RoHS compliance testing and is capable of achieving the necessary detection limits. The RoHS directive, as with any governmental legislation, is somewhat complicated in that there are a variety of exemptions where the restricted materials may be used.
The Orbis micro-XRF elemental analyzer has several advantages for RoHS compliance testing. The presence of several collimators with different spot sizes allows mapping of larger areas first in order to identify suspicious areas. These areas then can be analyzed in detail with a µ X-ray spot.
Presented instrument features include
• Small sample analysis
• Localized analysis on larger samples (e.g. PCB's) selected via the sample's video image
• Elemental mapping
• Primary beam filters for improved detection limits on a variety of samples
Presented application examples include
• Quantification of Cd and Pb in polymer material
• Quantification of Pb in metals and solder
• Mapping of PCBs with low lateral resolution
• Quantification of Pb etc. in identified features in elemental maps
• Mapping of PCBs with high lateral resolution
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Max Channel Spectrum Explained March 2011
Maximum pixel spectrum functionality was introduced in 2004 by Bright & Newbury of NIST and was quickly adopted by commercial EDS systems to allow expanded data investigation from full spectral map data cubes. This software tool uncovers rare spectral events and underrepresented elements which may be present in only one or a few pixels of the entire data cube. A derived spectrum is produced from the data cube which allows the user to easily see peaks which may not be visible in the sum spectrum of all spectra in the data cube. Further analysis then pinpoints the map location of a selected channel or peak. Complementary to spectral map analysis, the selected area spectrum can be further analyzed or maps reproduced with additional elements.
With recent updates to the performance of the Max Channel Spectrum routine, TEAM™ EDS brings the first new enhancement of this capability since its introduction. Ability to increase pixel binning for max channel reconstruction brings more flexibility to the analysis of data and helps further the strength of TEAM™ EDS.
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Texture Analysis with OIM™ February 2011
OIM™ is the most comprehensive automated Electron Backscatter Diffraction (EBSD) system that is available for analyzing all aspects of crystalline microstructures. In particular, EBSD is used to measure the crystallographic orientations of polycrystalline samples by controlling either the electron beam or the mechanical stage in the scanning electron microscope. The collected EBSD data is then used to show the preferred crystal orientation, or texture, that is present in the sample. Even though the generation of pole figures and orientation distribution plots can be performed very quickly with software capabilities, the interpretation of these plots require tremendous knowledge from the user.
In this seminar we discuss
• The general procedures often used to investigate whether preferred crystal orientations are present
• The basics of pole figures and other orientation distribution representations such as Bunge Euler angle
space and Rodrigues vector space
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TEAM™ 2.0 Has Arrived! January 2011
The EDAX TEAM™ EDS software was introduced in December of 2010. TEAM™ EDS 2.0 marks a major step with the most commonly used collection and review process available directly in the TEAM™ software.
This web session reviews the new features of TEAM™ 2.0, with an emphasis on spectrum collection tools including free hand draw, post-mapping review functions with several spectrum rebuild options and data view/reporting including screen capture and multi-maps layout.
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| Click here for 2010 recorded Microanalysis Web Seminars |
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