A Rich History of Innovation and Leadership
EDAX is the global leader in Energy Dispersive X-ray Microanalysis, Electron Backscatter Diffraction, and Micro X-ray Fluorescence systems. EDAX manufactures, markets, and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.
Since its founding in 1962, EDAX has utilized its knowledge and expertise to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electric motors with annualized sales of more than $1.8 billion.
Some landmark events that portray EDAX's commitment to maintaining a technology leadership position include:
2013
Introduction of WDS as part of the TEAM™ Analysis System
2012
Introduction of the Octane Silicon Drift Detector (SDD) Series
Release of TEAM™ Pegasus integrated EDS and EBSD analysis system
2011
Release of Coating Analysis Software for Orbis Micro-XRF Systems
Introduction of the Apollo XLT SDD Series for the Transmission Electron Microscope (TEM)
2010
Introduction of OIMTM 6.0 Software
2009
Introduction of the TEAMTM EDS Analysis System
Introduction of the Apollo X and XL Silicon Drift Detector Series
2008
Introduction of the Orbis Micro-XRF Spectrometer
Introduction of the Apex X-ray Microanalysis System
Introduction of the DigiView IV Electron Backscatter Diffraction Detector
Release of EXpert ID Revolutionary Element Identification Software Available within Genesis
2007
Introduction of the Apollo Silicon Drift Detector Series
2006
EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division
Introduction of high speed Hikari EBSD Detector
Introduction of OIMTM 3D Data Collection and Processing Tool
2005
Introduction of TEXS HP wavelength dispersive X-ray spectrometer
Introduction of the Eagle III XPL automated filter option
Introduction of DigiView III CCD Detector
2004
Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS
Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis
Release of Element Detective within Genesis
2003
Introduction of the third generation Eagle µ-Probe micro-focus XRF
Introduction of DigiView II firewire CCD Detector
2002
Introduction of Genesis system, which includes new hardware and multiple detector capabilities combined with Genesis software
Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD
Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector
Release of ChI-Scan software to incorporate elemental composition into the indexing process in EBSD
EDAX celebrates its 40th anniversary!
EDAX achieves re-certification to the ISO9001:2000 standard |
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2001
AMETEK Inc. acquires EDAX Inc.
Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power
Introduction of DigiView high-speed, high resolution CCD detector, the first fully digital EBSD detector
2000
Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions
Introduction of Delphi, an integrated EBSD/EDS phase identification product
1999
EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis
Introduction of Automated Crystallography for the TEM (ACT)
1998
Introduction of the Falcon EDS system; providing economy and performance
1997
Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF
Introduction of the OIM™ EBSD System on PC platform
First simultaneous OIM™/EDS scan
1996
Introduction of the Phoenix - the first Windows-NT based EDS system
Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector
1995
Introduction of the DX PRIME, a PC Windows-95 based EDS system
Introduction of the CryoSpec liquid nitrogen free detector
1994
TexSEM Laboratories (TSL) founded by the OIM™ development team offers the first commercially available fully automated EBSD System
1993
Introduction of the DX-95 XRF system
ISO 9001 certification
1992
Introduction of DX-4, the world's first and most popular Windows based EDS system
Introduction of EDAX's unique compact detecting unit (CDU)
Introduction of the first fully automated EBSD system (OIM™)
1987
Introduction of the PV9800 EDS X-ray microanalysis system
1985
Introduction of the PV9900 EDS X-ray microanalysis system
1984
First commercially available EBSD System (developed by the forerunner to TSL)
1982
First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley
1979
Introduction of the PV9500 XRF System
1978
Introduction of the PV9100 EDS X-ray microanalysis system
1972
Nuclear Diodes becomes EDAX International, Inc.
Introduction of the ECON, the first windowless detector
1969
Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications
1964
Introduction of LN2-cooled detectors
1962
Company founded under the name Nuclear Diodes